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Terahertz cyclotron resonance spectroscopy of an AlGaN/GaN heterostructure using a high-field pulsed magnet and an asynchronous optical sampling technique

机译:使用高场脉冲磁体和异步光学采样技术的alGaN / GaN异质结构的太赫兹回旋共振谱

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摘要

Recently, compact pulsed magnets have been developed, which can provide the high magnetic fields (up to 30 T) that were previously only accessible at national-scale facilities on a table-top in a laboratory environment.9 There have also been several reports of cyclotron resonance spectrometers being developed that combine pulsed magnetic fields with broadband laser-based terahertz radiation sources.10–12 Laser-based terahertz spectroscopy is a time-domain technique that typically employs slow scanning mechanical delay stages to acquire the terahertz waveforms through combining time-delayed near-infrared and terahertz pulses in a nonlinear medium or photoconductive antenna. The key challenge in utilizing these sources with pulsed magnetic fields has been in developing a detection scheme that can measure the terahertz waveforms within the several millisecond duration of the magnetic field.Approaches to achieving this have included both replacing the slow mechanical delay stage with a fast rotating mirror10 and using two lasers synchronized with an electronically controlled optical sampling (ECOPS) technique.12 The ECOPS scheme was the most suitable method for use with short duration magnetic field pulses as Noe II et al.12 showed that it could be used to record four terahertz waveforms during an approximately 14 ms magnetic field pulse.In this letter, we report on the characterization of the 2DEG in an AlGaN/GaN heterostructure at a temperature of 77 K. The measurements were carried out using a laboratory-based cyclotron resonance spectrometer that incorporated a high-field pulsed magnet and an asynchronous optical sampling (ASOPS) terahertz detection scheme. The use of an ASOPS scheme allowed around 100 terahertz waveforms to be recorded over the approximately 14 ms magnetic field pulse. This enabled the determination of the effective mass, sheet density, and mobility for electrons in the 2DEG as 0.228 ± 0.002m0, 8.0 × 1012 cm−2, and 9000 cm2 V−1 s−1, respectively. Prior to studying the AlGaN/GaN heterostructure, the capabilities of the spectrometer were determined using a high-mobility AlGaAs/GaAs heterostructure. The spectrometer was shown to be able to measure a 2DEG with a sheet density greater than 2.6 × 1011 cm−2 and a mobility of up to 1.8 × 105 cm2 V−1 s−1..
机译:最近,已经开发出紧凑的脉冲磁体,它可以提供高磁场(高达30 T),而以前只能在实验室环境中的台式台式国家规模的设施中才能使用这些磁场。9回旋加速器共振光谱仪正在开发中,它将脉冲磁场与基于宽带激光的太赫兹辐射源相结合。10-12基于激光的太赫兹光谱学是一种时域技术,通常采用慢速扫描机械延迟级来通过结合时间来获取太赫兹波形。非线性介质或光电导天线中的延迟近红外和太赫兹脉冲。利用这些具有脉冲磁场的源的关键挑战在于开发一种检测方案,该方案可以在几毫秒的磁场持续时间内测量太赫兹波形,实现这一目标的方法包括以快速的速度取代缓慢的机械延迟阶段。旋转镜10并使用与电子控制光学采样(ECOPS)技术同步的两个激光器。12ECOPS方案是最适合用于短时磁场脉冲的方法,因为Noe II等人[12]证明可用于记录在大约14µms的磁场脉冲中产生四个太赫兹波形。在这封信中,我们报告了在77 K的温度下AlGaN / GaN异质结构中2DEG的表征。测量是使用基于实验室的回旋共振光谱仪进行的它结合了高磁场脉冲磁体和异步光学采样(ASOPS)太赫兹检测方案我。使用ASOPS方案可以在大约14µms的磁场脉冲上记录大约100太赫兹的波形。这样就可以确定2DEG中电子的有效质量,薄层密度和迁移率分别为0.228±0.002m0、8.0×1012 cm-2和9000 cm2 V-1 s-1。在研究AlGaN / GaN异质结构之前,使用高迁移率的AlGaAs / GaAs异质结构确定光谱仪的功能。经证明,该光谱仪能够测量2DEG,其片密度大于2.6×−1011 cm-2,迁移率高达1.8×105 cm2 V-1 s-1。

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